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Dear All,<BR>
<BR>
I want to plot the DOS and PDOS for the semiconductors ( the CdS with point defect ).<BR>
In the pw.x calculation, I set the occupation = 'fixed',<BR>
<SPAN lang=EN></SPAN> <BR>
<SPAN lang=EN>For the DOS and PDOS, there are several smearing schemes:</SPAN><BR>
<SPAN lang=EN>0 Simple Gaussian</SPAN><BR>
<SPAN lang=EN>1 Methfessel-Paxton of order 1<BR>-1 Marzari-Vanderbilt "cold smearing"<BR>-99 Fermi-Dirac function</SPAN><BR>
<SPAN lang=EN><BR>Which one is the best for the semiconductor DOS and PDOS?</SPAN><BR>
<SPAN lang=EN></SPAN> <BR>
<SPAN lang=EN>Actually I intended to adopt the occupation= "tetrahedra" for the DOS calculation, </SPAN><BR>
<SPAN lang=EN>but " The tetrahedron method is presently not implemented" in PDOS calculation, </SPAN><BR>
<SPAN lang=EN>so it's hard to match the DOS and PDOS exactly if I choose the different smearing scheme for the PDOS.</SPAN><BR>
<BR>
Any advice will be appreciated<BR>
<BR>
Thank you.<BR>
<BR>
Rgds<BR>
<BR>
Jianchun Wu<BR>Department of physics<BR>Soochow university,China<BR>215006<BR> </body>
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